Precision testing electronics: the first set of open-field optical defect detection equipment and semiconductor wafer stress measurement equipment has been delivered.

[precision testing Electronics: open Field Optical defect Detection equipment, Semiconductor Silicon Wafer stress Measurement equipment has completed the delivery of the first set] April 19, FAP said on the interactive platform, the company's open field optical defect detection equipment, semiconductor wafer stress measurement equipment has completed the delivery of the first (set), is currently in the process of verification.